This research studied ways to reduce image sensor reset noise. A compact and an efficient column-level active-reset technique for reducing kT/C noise yielded pixels with as little as 44 microvolts output noise and as low as 5.1 e- input-referred noise at room temperature. Per-pixel correlated double sampling provided a factor of four reduction in reset noise, and sensitivity was such that the capture and emission of single electrons (causing so-called random telegraph noise) was clearly visible.

Related publications:

1. •[J44] S. Kleinfelder, F. Bieser, Y. Chen, R. Gareus, H. S. Matis, M. Oldenburg, F. Retiere, H. G. Ritter, H. H. Wieman, E. Yamamoto, "Novel Integrated CMOS Sensor Circuits," IEEE Transactions on Nuclear Science, Vol. 51, No. 5, October 2004.
   

2. •[C52] M. Ahooie, S. Kleinfelder, “Monolithic Charged Particle Imaging using Per- Pixel Correlated Double Sampling,” Proceedings of 2006 IEEE Nuclear Science Symposium, San Diego, CA, October 2006.
   

3. •[C46] Y. Chen, S. Kleinfelder, “CMOS active pixel sensor achieving 90 dB dynamic range with column-level active reset,” Proceedings of the SPIE, Electronic Imaging Science and Technology, Vol. 5301, pp 438-449, January 2004.